Rocking curve peak shift in thin semiconductor layers

Rocking curve peak shift in thin semiconductor layers

Rocking the curve.

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X-ray diffraction characterization of multilayer semiconductor structures*

The analysis of double-crystal x-ray rocking curves of single-crystal layered structures can give valuable information on layer strains, displacement of atoms from normal lattice sites (which reduces the structure factor), crystallographic misorientations, and crystal defects. Both strains and misorientations cause shifts in the Bragg angle. These two effects are readily separated using two or ...

Long-range surface plasmon polaritons at THz frequencies in thin semiconductor layers

We present a theoretical investigation of THz long-range surface plasmon polaritons propagating on thin layers of InSb. The metallic behavior of doped semiconductors at THz frequencies allows the excitation of surface plasmon polaritons with propagation and confinement lengths that can be actively controlled. This control is achieved by acting on the free carrier density, which can be realized ...

Diamond X-ray Rocking Curve and Topograph Measurements at CHESS

X-ray rocking curve and topograph measurements were carried out at CHESS in Cornell University in November 2006. The purpose of this experiment was to check if the X-ray facility at CHESS is suitable to be used for GlueX in assessing diamond crystal quality and investigating radiation damage and surface deformation induced by milling. After modifying the C1 beam line by using an asymmetry silic...